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1

[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Re-Configuration of Sub-blocks for Effective Application of Time Domain Tests

Anders, Jens, Krishnan, Shaji, Gronthoud, Guido

Year:

2007

File:

PDF, 588 KB

2007

2

Multi-VDD Testing for Analog Circuits

José Pineda de Gyvez, Guido Gronthoud, Rachid Amine

Journal:

Journal of Electronic Testing

Year:

2005

Language:

english

File:

PDF, 2.07 MB

english, 2005

3

[IEEE 2008 13th IEEE European Test Symposium (ETS) - Verbania, italy (2008.05.25-2008.05.29)] 2008 13th European Test Symposium - Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design

Zivkovic, Vladimir A., Heyden, Frank van der, Gronthoud, Guido, Jong, Frans de

Year:

2008

Language:

english

File:

PDF, 356 KB

english, 2008

4

[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - On Performance Testing with Path Delay Patterns

Kruseman, Bram, Majhi, Ananta, Gronthoud, Guido

Year:

2007

Language:

english

File:

PDF, 253 KB

english, 2007

5

ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus

Xiaoqin Sheng, Hans Kerkhoff, Amir Zjajo, Guido Gronthoud

Journal:

Journal of Electronic Testing

Year:

2012

Language:

english

File:

PDF, 619 KB

english, 2012

6

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Power Supply Noise in Delay Testing

Wang, Jing, H. Walker, D., Majhi, Ananta, Kruseman, Bram, Gronthoud, Guido, Villagra, Luis, De Wiel, Paul, Eichenberger, Stefan

Year:

2006

Language:

english

File:

PDF, 258 KB

english, 2006

7

Structural Fault Modeling and Fault Detection Through Neyman–Pearson Decision Criteria for Analog Integrated Circuits

Amir Zjajo, Jose Pineda de Gyvez, Guido Gronthoud

Journal:

Journal of Electronic Testing

Year:

2006

Language:

english

File:

PDF, 439 KB

english, 2006

8

[IEEE 2009 14th IEEE European Test Symposium (ETS) - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - Algorithms for ADC Multi-site Test with Digital Input Stimulus

Sheng, Xiaoqin, Kerkhoff, Hans, Zjajo, Amir, Gronthoud, Guido

Year:

2009

Language:

english

File:

PDF, 264 KB

english, 2009

9

[IEEE 2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW 2008) - Vancouver, BC, Canada (2008.06.18-2008.06.20)] 2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop - Exploring dynamics of embedded ADC through adapted digital input stimuli

Xiaoqin Sheng,, Kerkhoff, Hans, Zjajo, Amir, Gronthoud, Guido

Year:

2008

Language:

english

File:

PDF, 113 KB

english, 2008

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